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Klocke, V. & Jones, G. E. (2011, August). THE SEM/FIB WORKBENCH: Automated Nanorobotics System Inside of Scanning Electron or Focused Ion Beam Microscopes. Oral presentation and poster session at IEEE Nano 2011, Portland, OR.
National Academies of Astro 2010 Position Paper
IEEE Nano 2011 - Portland, OR
Microscopy & Microanalysis (M&M) 2011 - Nashville, TN
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ONAMI Micro/Nano 2009 - Portland, OR
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