Home
Semiconductor
ABOVE - Silcon stress test using WITec Confocal RAMAN
RIGHT - Soldier balls under HIVac, using TESCAN MIRA3.
RIGHT- SIGNATONE CM-330 MKII probe station for FA and characterization.
Applications
Copyright (C) 2011 Eclipse Technologies
info@eclipse-t.com
503-442-2928
CLICK HERE for WITec
CLICK HERE for TESCAN
CLICK HERE for SIGNATONE
CLICK HERE for ISTS
CLICK HERE for GIGATEST LABS
CLICK HERE for CHECKPOINT
CLICK HERE for KLOCKE NANOTECHNIK
Aerospace
Ag/ Food Science
Bio/Pharma
Energy
Geology/Mining
Semiconductor
Industries
Analytical Imaging
Ultra-High Vacuum
Vibration/Noise
Microprobing
Incubators/Ovens
Products
Drug Dispersion
Material Characterization
Microelectric Devices
Semiconductor FA
Solar Energy
Surface Mapping
Virology/Hematology
Applications
Request Info
Calendar
Line Card
Bio Line Card
Astro
BugE
Contact
About