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SEM, FIB-SEM, RAMAN, NSOM, SNOM, UV and NIR systems with analytical capabilities. Instrumentation includes microspectrophotometers, nano probers, and tools for cutting, probing and manipulation on the nano scale.

Semiconductor

Analytical Imaging

Eclipse represents a diverse line of RF, DC, MEMS, and laser probers for semiconductor R&D and failure analysis. These include imaging tools for LADA, TIVA, LIVA, OBIC, OBRHC, SDL, and a full line of probe stations for 2" to 300mm wafers. We carry electronic test equipment, including oscilloscopes, ARBS, sectrum analyzers, meters and power supplies.

Semiconductor Test

Analytical Imaging

Ultra-High Vacuum

Vibration/Noise Management

Geology/Mining

Tools for new energy exploration, elemental analysis, chemistry, photovoltaics, and clean energy solutions.
Semiconductor
Energy
Geology/Mining
Aerospace
Industries
Analytical Imaging
Microprobing
Vibration/Noise
Ultra-High Vacuum
Products

Aerospace

We have a wide array of instruments for component inspection, failure analysis, metelergy and materials research. This includes SEM, microprobers, and vacuum leak detection systems.

Energy

Material Characterization
Semiconductor FA
Microelectric Devices
Surface Mapping
Energy
Applications
Tools for new energy exploration, elemental analysis, chemistry, photovoltaics, and clean energy solutions.
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